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Semiconductor

New Technology Tester Leader

UNI92K
UNI92K

This tester detects early defects of the storage device (SSD) by examining the performance. This tester is applicable to various types of form factors (U.2, M.2, FHHL) and interface protocols (PCIe NVMe).

Test Device PCIe Gen4 SSD (M.2 U.2/U.3 FHHL BGA)
Parallelism 512
Data Rate 16Gbps
Temperature Range -40℃ ~ 125℃
Dimension
(W x D x H, mm)
3,300 x 1,800 x 2,300
Operating System Linux
UNI92KR-6B
UNI92KR-6B

This tester device detects initial errors of storage device (SSD) by examining the performance. This tester is applicable to various types of form factors (U.2, M.2, FHHL) and interface protocols (PCIe NVMe).

Test Device PCIe Gen4 SSD (M.2 U.2/U.3 FHHL)
Parallelism 192
Data Rate 16Gbps
Temperature Range 70℃±5℃ (with loading)
Dimension
(W x D x H, mm)
720 x 1,250 x 2600
Operating System Linux
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