UNI5900
After all process of memory semiconductors is completed, this tester examines the electric performances of packaged devices, such as device speed, data Read/Write and Refresh.
| Test Device | LPDDR4, GDDR5,DDR5 |
|---|---|
| Parallelism | 512 |
| Speed | 9Gbps |
| Temperature Range | -40℃ ~ 125℃ |
| Dimension (W x D x H, mm) |
Main Frame: 800 x 1,020 x 2,155
Test Head: 1,400 x 1,000 x 962 |
| Operating System | Linux |
